FPGA to ASIC Conversion: When, Why, and How to Make the Transition
6 min read
Articles

FPGA to ASIC Conversion: When, Why, and How to Make the Transition

By Marion Loizurot, on Aug 25, 2026

A practical guide to evaluating cost, performance, power consumption, and flexibility when moving ...

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An Ultra-Low-Power Integrate-and-Fire ADC for Compact Current Measurement
7 min read
Technical Case

An Ultra-Low-Power Integrate-and-Fire ADC for Compact Current Measurement

By Helle Rosenberg, on Apr 21, 2026

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Preparing for EU Radio Equipment Directive: What the New Cybersecurity Rules Mean for Semiconductors
4 min read
Articles

Preparing for EU Radio Equipment Directive: What the New Cybersecurity Rules Mean for Semiconductors

By Marion Loizurot, on Jul 29, 2025

Ensuring Secure, Compliant Chip Design Ahead of August 2025.

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Enabling Smarter Point-of-Care Testing Devices with Custom ASICs
2 min read
Featured

Enabling Smarter Point-of-Care Testing Devices with Custom ASICs

By Marion Loizurot, on Jun 11, 2025

As demand grows for decentralized and efficient diagnostic tools, point-of-care testing (POCT) is ...

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ASIC Power Management: Extending IoT Device Battery Performance
2 min read
Articles

ASIC Power Management: Extending IoT Device Battery Performance

By Marion Loizurot, on May 28, 2025

Efficient power management is critical to extending the lifespan of IoT devices. In many ...

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Energy Harvesting in IoT for Long-Lifetime Devices
3 min read
Articles

Energy Harvesting in IoT for Long-Lifetime Devices

By Marion Loizurot, on May 15, 2025

Digitized IoT systems are now part of daily life, spanning smart cities and homes, supply chain ...

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Building an ASIC - Where do you start?
6 min read
Articles

Building an ASIC - Where do you start?

By Marion Loizurot, on Apr 17, 2025

Developing a custom ASIC is complex but with the right approach and partners, it becomes a ...

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ASIC vs Discrete Solution: Why Custom Chips Win in the Long Run
3 min read
Articles

ASIC vs Discrete Solution: Why Custom Chips Win in the Long Run

By Marion Loizurot, on Mar 26, 2025

When comparing an ASIC vs a discrete solution, the initial development cost is often a key concern. ...

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Scanning Acoustic Microscopy (SAM) for Identifying Potential Failures in Electronic Components
8 min read
Technical Case

Scanning Acoustic Microscopy (SAM) for Identifying Potential Failures in Electronic Components

By Helle Rosenberg, on Mar 20, 2025

How can you tell a defect from a harmless imperfection? In failure analysis, precision matters. ...

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