Qualification and Failure Analysis

One of the most complex stresses in a new product qualification is high/low temperature operating life (HTOL/LTOL - device qualification) and highly accelerated stress test (HAST - package qualification). Those stresses are biased (both require sockets and custom PCBs), long (typically 1,000-3,000 hours for HTOL) and often require complex electrical stimulations.

Presto Engineering will help develop and qualify appropriate electrical stimulations using our co-located testers and extensive test experience. We also support tester-based read-points with fast turn-around time.

More often than not, a customer's ASIC is limited by the capabilities of the reliability chambers and capacity to handover test patterns/burn-in patterns from test production/characterization to reliability. Our ability to customize device reliability boards incorporating specific electronics to bridge the gap our customers need to stimulate their device and reflect the actual mission profile stress conditions.
We carefully select the right sockets and PCB technologies for the thermal (HTOL/HAST) and humidity (HAST) performances required.
Our ovens support sophisticated driver combinations in the chamber (hot) and outside (room). While standard systems max out at 100MHz clock speed, we leverage our RF experience into applications up to 2GHz. Our systems include chamber-controlled and socket-control temperature as well as custom systems (especially for RF applications) with device-controlled temperature.
Presto Engineering also supports full, in-situ monitoring of both electrical and thermal behavior.