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"First-Silicon Encounters"

New product ramp-up to production is sometimes smooth and easy, with all that is promised by “right first time” design methodologies. But sometimes first silicon comes back from the foundry with issues. Obviously, it’s critical to characterize, isolate and debug the device to identify the root cause or causes and fix the problems in a timely manner.

Based on numerous three-alarm fires Presto has helped extinguish, we have categorized the four most common problems we have seen with first silicon: scan-chain failures, excess leakage current, signal integrity, and timing. In the process, we’ve developed techniques and procedures and acquired the specialized equipment (e.g. ATE, laser scanning microscopes, e-beam, FIB) that isolate issues and allow our customers to move forward quickly with their product release.

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