ATE Docking Solutions

Modern validation and debug techniques require the device under test to be fully exercised by a tester (ATE) while being analysed. Most in-silicon tools used for electrical failure analysis must therefore be connected, both mechanically or electrically, to ATE.

Presto Engineering provides load modules that connect testers and in-silicon analysis tools like emission microscopes, laser scanning microscopes, E-Beam probers, laser voltage probers and time-resolved emission systems. These come in 512-pin ands 768-pin versions.

We also provide provide docking schemes to most current ATE.

Docking plates like that shown left support fast and easy docking between a high-end tester and an analysis tools.

Through careful design of alignment features, connection is robust and repeatable. These plates also incorporate provisions for thermal solutions.