Root Cause Analysis

Our partnership with UbiMOS brings the following services to our customers, transparently integrated into PrestoPE engagements:

  • CMOS device analysis, characterization and troubleshooting
  • Front-end process and device design for high performance transistor and reliability
  • Product-specific device modeling for logic and RF technologies
  • MOS reliability characterization and improvement for transistors and gate oxide (such as HCI, TDDB, NBTI, PBTI, plasma process-induced damage, latch-up)
  • UbiMOS-proprietary suite of test structures for comprehensive technology characterization for device performance and reliability
  • Customized test chip design
  • Foundry technology assessment and benchmarking
  • Technology report and white paper