Growing device performance, especially as they interface with each other, has driven I/O test requirements in the Gbps arena. With increased pin counts and memory depths, it has dramatacilly increased the cost of what is commonly called 'big-iron' (or functional) testers.

Conversely, advanced process technology provides more 'real estate' to designers, and more on-board hardware resources to the test methodologies geared on using them. Design-for-test (DFT) was born from this evolution, with Scan methodologies now widely accepted, and Built-In-Self-Test (BIST) increasingly considered as a favorable alternative to full, at-speed, functional test.

Presto Engineering's Dual Test Platform concept leverages those trends by offering designers and product engineers the opportunity to benefit from the best of both worlds.

The main thrust of product release can remain focused on developing test solutions (probe and final) that optimize coverage and cost--targeting these test platforms that are widely available in volume test facilities. PrestoPE provides a parallel path (entirely performed by Presto Engineering), encompassing validation and most characterization, based on a flexible, cost-effective, scan-based test platform.

Presto Engineering experts develop the parallel test solutions (as part of the registration process at tape-out), perform any applicable correlations with fuctional platform, and deliver clean, already debugged, scan and BIST vectors for production.

Additionally, the validation test platform is the ideal vehicle (flexible and cost-effective) for analysis, debug and failure analysis--may the need arise for such projects.

Please call us at 408-434-1808 x303 or contact us and schedule a discovery meeting to understand how Presto Engineering will provide you with the value of state-of-the-art test and failure analysis—at a cost your business can afford.