Our partnership with Nanolab Technologies bring to our customers a comprehensive set of microscopy and analytical capabilities, that can be used seamlessly whithin PrestoPE projects or engagements.

Available Physical Failure Analysis capabilities include:

• Real-time X-Ray (RTX)
• Scanning Acoustic Microscopy (C-SAM)
• Sample de-cap and de-processing
• Backside sample preparation
• Scanning Electron Microscopy (FEI NanoSEM 630, XL 30)
• Focus Ion Beam (FEI V-600)
• Transmission Electron Microscopy (JEOL 3010)
• Deep Ultra Violet Microscopy
• Dual-Beam FIB/SEM, 8" wafer capable (FEI 855)

Nanolab Technologies has just moved into San Jose, and is now conveniently located at walking distance (one block) from our operations on North First Street.